XRF-Spectrometer

• Description:

  XRF-Spectrometer is a microprocessor controlled high-count throughput unit with low detection limits for wide range of elements. Provision of multi-elemental analysis with detection limits upto 1 ppm. Built-in movable platform for easy location of testing point.High resolution detector improves analysis accuracy. Equipped with safety features of optical tube shielding with no X-ray radiation and high voltage emergency locking.

• Specifications:

  Measureable elements: S to U Detection limit: 1 ppm Temperature: 15 ~ 30 °C Elemental content: 1 ppm to 99 % Repeatability: 0.001 Stability: 0.001 Power supply: AC 220 V ± 5 V Dimensions: 550 x 410 x 320 mm Weight: 45 kg

• Applications:

  Used in detection of plating thickness of metals, concentration of plating solution, RoHS detection and analysis, full-element analysis and electro plating industries

• Features & Benefits:

  Beam Configuration :Dual Channel Measuring Range :As, Se, Pb, Bi, Sb, Te, Sn < 0.01 µg/L Hg, Cd < 0.001 µg/L Zn < 1.0 µg/L Ge < 0.1 µg/L Precision (RSD) :< 1.0 Linear range :More than 3 orders of magnitude